Investigation of the applicability of parametric x-ray radiation for transverse beam profile diagnostics

G. Kube, C. Behrens, A. S. Gogolev, Yu P. Popov, A. P. Potylitsyn, W. Lauth, S. Weisse

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

12 Цитирования (Scopus)

Аннотация

Optical transition radiation (OTR) which is observed in backward direction when a charged particle beam crosses the boundary between two media with different dielectric properties is widely used as standard technique for transverse beam profile diagnostics in electron linacs. The experience from modern linac based light sources like LCLS or FLASH shows that OTR diagnostics might fail because of coherence effects in the OTR emission process. A possibility to overcome this limitation is to measure at much shorter wavelengths, i.e. in the X-ray region, using parametric X-ray radiation (PXR) which additionally offers the advantage to be generated at crystal planes oriented under a certain angle to the crystal surface, thus allowing a spatial separation from a possible coherent OTR background. A first test experiment has been performed at the Mainz Microtron MAMI in order to study the applicability of PXR for beam diagnostics, and status and results of this experiment are reported.

Язык оригиналаАнглийский
Название основной публикацииIPAC 2013
Подзаголовок основной публикацииProceedings of the 4th International Particle Accelerator Conference
Страницы491-493
Число страниц3
СостояниеОпубликовано - 24 дек 2013
Событие4th International Particle Accelerator Conference, IPAC 2013 - Shanghai, Китай
Продолжительность: 12 мая 201317 мая 2013

Другое

Другое4th International Particle Accelerator Conference, IPAC 2013
СтранаКитай
ГородShanghai
Период12.5.1317.5.13

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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