Investigation of plastic deformation development at mesoscale level in composition with cold-sprayed coatings

N. N. Korobkina, S. V. Panin, A. P. Alkhimov

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

Depending on the relationships of adhesive and cohesive strengths of gas-dynamic coatings three major versions of plastic flow evolution can be revealed in composition under investigation. Incompatibility of plastic flow evolution in the coating and substrate causes the local bending of specimen which is the major cause of nucleation of the stress concentrator at the interface. The propagation of transverse cohesive crack in the coating as well as adhesive crack along the interface are the result of its relaxation.

Язык оригиналаАнглийский
Название основной публикацииProceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001
ИздательInstitute of Electrical and Electronics Engineers Inc.
Страницы71-73
Число страниц3
ISBN (печатное издание)0780363469, 9780780363465
DOI
СостояниеОпубликовано - 2001
Событие7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001 - Tomsk, Российская Федерация
Продолжительность: 26 фев 20012 мар 2001

Другое

Другое7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001
СтранаРоссийская Федерация
ГородTomsk
Период26.2.012.3.01

ASJC Scopus subject areas

  • Biotechnology
  • Computer Science Applications
  • Civil and Structural Engineering
  • Mechanical Engineering
  • Materials Science (miscellaneous)
  • Instrumentation
  • Education

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  • Цитировать

    Korobkina, N. N., Panin, S. V., & Alkhimov, A. P. (2001). Investigation of plastic deformation development at mesoscale level in composition with cold-sprayed coatings. В Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001 (стр. 71-73). [983738] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MTT.2001.983738