Investigation of buried quantum dots using grazing incidence X-ray diffraction

P. Schroth, T. Slobodskyy, D. Grigoriev, A. Minkevich, M. Riotte, S. Lazarev, E. Fohtung, D. Z. Hu, D. M. Schaadt, T. Baumbach

Результат исследований: Материалы для журналаСтатья

5 Цитирования (Scopus)

Аннотация

Self-organized, buried InAs quantum dots covered by an AlAs diffusion barrier were investigated under UHV conditions using grazing incidence X-ray diffraction. The experimental data is compared to the simulated results obtained by Finite Element Method and Distorted Wave Born Approximation. We have found that the simulated data could be compared to the experimental one only after convolution by the resolution element which can be estimated from the experiment. By adjusting the simulation parameters we were able to find good agreement between the simulated and the measured data.

Язык оригиналаАнглийский
Страницы (с-по)721-724
Число страниц4
ЖурналMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
Том177
Номер выпуска10
DOI
СостояниеОпубликовано - 5 июн 2012
Опубликовано для внешнего пользованияДа

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

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  • Цитировать

    Schroth, P., Slobodskyy, T., Grigoriev, D., Minkevich, A., Riotte, M., Lazarev, S., Fohtung, E., Hu, D. Z., Schaadt, D. M., & Baumbach, T. (2012). Investigation of buried quantum dots using grazing incidence X-ray diffraction. Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 177(10), 721-724. https://doi.org/10.1016/j.mseb.2011.10.012