Investigation of behaviour of surface hardened steels with different interface profiles under tension

A. V. Koval, S. V. Panin

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

The difference in mechanical characteristics of coating and matrix, the presence of transition layers and different geometry of the interface profile define the different character of emergence of stress mesoconcentrators at the interface, the way of their relaxation, the type of mesostructure formed as well as the nature of development of plastic deformation of the whole composition at the mesoscale level.

Язык оригиналаАнглийский
Название основной публикацииProceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001
ИздательInstitute of Electrical and Electronics Engineers Inc.
Страницы75-77
Число страниц3
ISBN (печатное издание)0780363469, 9780780363465
DOI
СостояниеОпубликовано - 2001
Событие7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001 - Tomsk, Российская Федерация
Продолжительность: 26 фев 20012 мар 2001

Другое

Другое7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001
СтранаРоссийская Федерация
ГородTomsk
Период26.2.012.3.01

ASJC Scopus subject areas

  • Biotechnology
  • Computer Science Applications
  • Civil and Structural Engineering
  • Mechanical Engineering
  • Materials Science (miscellaneous)
  • Instrumentation
  • Education

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  • Цитировать

    Koval, A. V., & Panin, S. V. (2001). Investigation of behaviour of surface hardened steels with different interface profiles under tension. В Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001 (стр. 75-77). [983740] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MTT.2001.983740