Intelligent learning and testing system for students training in the problem area of nanotechnology and microsystem engineering

D. Lyapunov, A. Yankovskaya, Y. Dementyev, K. Negodin

Результат исследований: Материалы для журнала

Аннотация

For the students learning and training in the field of nanotechnology and microsystem engineering within the framework of blended learning paradigm we need high quality content; efficient learning technology; means of students motivation; evaluation tools. We propose an intelligent learning and testing system based on mixed diagnostic tests for effective comprehension of a number of subjects within the problem area. The system allows to provide effective comprehension of a number of subjects and to form the primary competences from the students point of view, revealing their future occupation preferences. During the learning process the students within small groups (not less than 4 students) solve the problems of development, modelling and design of microsystem devices. They also investigate the market needs, consider the opportunities of macroscopic sensors and actuators exchange on their microsystem analogs.

Язык оригиналаАнглийский
Страницы (с-по)69-73
Число страниц5
ЖурналCEUR Workshop Proceedings
Том1900
DOI
СостояниеОпубликовано - 1 янв 2017
Событие2017 International Conference Information Technology and Nanotechnology. Session Computer Optics and Nanophotonics, CON-ITNT 2017 - Samara, Российская Федерация
Продолжительность: 24 апр 201727 апр 2017

ASJC Scopus subject areas

  • Computer Science(all)

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