Аннотация
The pore distribution on the wafer surface of ferroelectric ceramics Ba0.6Sr0.3Ca0.1TiO3 was investigated. The samples with diameter of 38-40 mm were sintered from green compacts being compacted under ultrasound action within a power of 1-3 kW and by uniaxial static moulding. The pore distributions were determined inside of wafer surface regions located from central point toward edges using SEM-data (scanning electron microscope TOPCON, Model ABT-32). The software ImageJ1.16 was used. The distribution regularities of small (less than 5 microns) and large pores depending on sample manufacture conditions were determined.
Язык оригинала | Английский |
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Название основной публикации | 5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001 |
Издатель | Institute of Electrical and Electronics Engineers Inc. |
Страницы | 251-254 |
Число страниц | 4 |
Том | 2 |
ISBN (печатное издание) | 0780370082, 9780780370081 |
DOI | |
Состояние | Опубликовано - 2001 |
Событие | 5th Korea-Russia International Symposium on Science and Technology, KORUS 2001 - Tomsk, Российская Федерация Продолжительность: 26 июн 2001 → 3 июл 2001 |
Другое
Другое | 5th Korea-Russia International Symposium on Science and Technology, KORUS 2001 |
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Страна | Российская Федерация |
Город | Tomsk |
Период | 26.6.01 → 3.7.01 |
ASJC Scopus subject areas
- Clinical Biochemistry
- Computer Networks and Communications
- Biotechnology
- Civil and Structural Engineering
- Mechanics of Materials
- Electronic, Optical and Magnetic Materials
- Materials Chemistry
- Surfaces, Coatings and Films