Influence of temperature gradient on diffracted X-ray spectrum in quartz crystal

A. R. Mkrtchyan, A. P. Potylitsyn, A. V. Vukolov, A. I. Novokshonov, A. S. Gogolev, R. V. Amiragyan, A. E. Movsisyan

Результат исследований: Материалы для журналаСтатьярецензирование


In this work characteristics of hard X-ray (with energy higher than 30 keV) were investigated. In the experiment we measured spectra of X-ray reflected by a quartz monocrystal in Laue geometry under influence of the temperature gradient. The measurements were made by the spectrometer BDER-KI-11K with 300 eV resolution on the 17.74 keV spectral line of Am241 and the spectrometer XR-100CR with 270 eV resolution on the same spectral line. An existence of temperature gradient leads to increasing of the diffracted beam intensity. The intensity was measured dependently on the temperature of one of the edge of the crystal.

Язык оригиналаАнглийский
Номер статьи012028
ЖурналIOP Conference Series: Materials Science and Engineering
Номер выпуска1
СостояниеОпубликовано - 2 авг 2016

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

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