In-service change in radiant power of infrared LEDs

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

2 Цитирования (Scopus)

Аннотация

At present infrared light emitting diodes are used in diverse scanning and optical security systems of nuclear and power plants. The purpose of work is research reducing radiant power during step-by-step accelerated test at higher ambient temperature. The objects of research are infrared light emitting diodes based on dual AlGaAs heterostructures. Two-stage reduction of radiant power has been revealed: first, it is decreased since the original defect structure is rearranged during the operating time; second, new structural defects appear during the further operating time. Moreover, devices are divided into three characteristic groups in view of the second stage, which probably have the same defect with three quasi-stationary states. We assume origination of this defect is caused by production technology of light emitting diodes.

Язык оригиналаАнглийский
Название основной публикации2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Proceedings
ИздательInstitute of Electrical and Electronics Engineers Inc.
ISBN (электронное издание)9781467383837
DOI
СостояниеОпубликовано - 14 июн 2016
Событие2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Moscow, Российская Федерация
Продолжительность: 12 мая 201614 мая 2016

Другое

Другое2016 International Siberian Conference on Control and Communications, SIBCON 2016
СтранаРоссийская Федерация
ГородMoscow
Период12.5.1614.5.16

ASJC Scopus subject areas

  • Signal Processing
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modelling and Simulation
  • Computer Networks and Communications

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  • Цитировать

    Gradoboev, A. V., Simonova, A. V., & Orlova, KN. (2016). In-service change in radiant power of infrared LEDs. В 2016 International Siberian Conference on Control and Communications, SIBCON 2016 - Proceedings [7491662] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SIBCON.2016.7491662