Hardware impaired self-energized bidirectional sensor networks over complex fading channels

Stefan R. Panic, Dushantha Nalin K. Jayakody, Sofiene Affes, Palanivelu Muthuchidambaranathan

Результат исследований: Материалы для журналаСтатьярецензирование

Аннотация

Rapid emergence of wireless sensor networks (WSN) faces significant challenges due to limited battery life capacity of composing sensor nodes. It is substantial to construct efficient techniques to prolong the battery life of the connected sensors in order to derive their full potential in the future Internet of Things (IoT) paradigm. For that purpose, different energy harvesting (EH) schemes are relying on a wide array of sources. Following the same objective, in this work, we have observed a time-switching EH for half-duplex (HD) bidirectional WSN, which performed in-between relaying over Hoyt fading channels. For its comprehensive performance analysis, rapidly converging infinite-series expressions have been provided with focus on the outage probability (OP) and achievable throughput of the hardware-impaired system. Additionally, asymptotic behavior of these performance measures has also been provided. Further, an approach to the symbol-error probability (SEP) analysis is also presented in the context of the observed system. Finally, we consider the shadowing influence along the WSN propagation path. Performance analysis of observed EH system operating over Rician-shadowed fading channels has been carried out, with deriving exact corresponding infinite-series expressions for outage probability (OP) and achievable throughput of the system under the hardware impairment conditions. In addition, bidirectional relaying in a mixed fading environment has been considered.

Язык оригиналаАнглийский
Номер статьи5574
Страницы (с-по)1-16
Число страниц16
ЖурналSensors (Switzerland)
Том20
Номер выпуска19
DOI
СостояниеОпубликовано - 1 окт 2020

ASJC Scopus subject areas

  • Analytical Chemistry
  • Biochemistry
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electrical and Electronic Engineering

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