Grating scanner for measurement of micron-size beam profiles

L. G. Sukhikh, A. P. Potylitsyn, S. A. Strokov, G. Kube, K. Wittenburg

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire that is of about 4 microns. Sub-micron beam sizes have to be resolved due to development of modern electron accelerators and future linear electron-positron colliders. In this report we propose to use a set of of gold stripes with varying period (gap) on a Si substrate. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.

Язык оригиналаАнглийский
Название основной публикацииProceedings of the 7th International Beam Instrumentation Conference, IBIC 2018
ИздательJoint Accelerator Conferences Website (JACoW)
ISBN (электронное издание)9783954502011
DOI
СостояниеОпубликовано - ноя 2018
Событие7th International Beam Instrumentation Conference, IBIC 2018 - Shanghai, Китай
Продолжительность: 9 сен 201813 сен 2018

Серия публикаций

НазваниеProceedings of the 7th International Beam Instrumentation Conference, IBIC 2018

Конференция

Конференция7th International Beam Instrumentation Conference, IBIC 2018
СтранаКитай
ГородShanghai
Период9.9.1813.9.18

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Fingerprint Подробные сведения о темах исследования «Grating scanner for measurement of micron-size beam profiles». Вместе они формируют уникальный семантический отпечаток (fingerprint).

  • Цитировать

    Sukhikh, L. G., Potylitsyn, A. P., Strokov, S. A., Kube, G., & Wittenburg, K. (2018). Grating scanner for measurement of micron-size beam profiles. В Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018 (Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018). Joint Accelerator Conferences Website (JACoW). https://doi.org/10.18429/JACoW-IBIC2018-wepb10