TY - GEN
T1 - Grating scanner for measurement of micron-size beam profiles
AU - Sukhikh, L. G.
AU - Potylitsyn, A. P.
AU - Strokov, S. A.
AU - Kube, G.
AU - Wittenburg, K.
PY - 2018/11
Y1 - 2018/11
N2 - Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire that is of about 4 microns. Sub-micron beam sizes have to be resolved due to development of modern electron accelerators and future linear electron-positron colliders. In this report we propose to use a set of of gold stripes with varying period (gap) on a Si substrate. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.
AB - Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire that is of about 4 microns. Sub-micron beam sizes have to be resolved due to development of modern electron accelerators and future linear electron-positron colliders. In this report we propose to use a set of of gold stripes with varying period (gap) on a Si substrate. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.
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U2 - 10.18429/JACoW-IBIC2018-wepb10
DO - 10.18429/JACoW-IBIC2018-wepb10
M3 - Conference contribution
T3 - Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018
BT - Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018
PB - Joint Accelerator Conferences Website (JACoW)
T2 - 7th International Beam Instrumentation Conference, IBIC 2018
Y2 - 9 September 2018 through 13 September 2018
ER -