Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy

H. Backe, W. Lauth, A. F. Scharafutdinov, P. Kunz, A. S. Gogolev, A. P. Potylitsyn

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

2 Цитирования (Scopus)

Аннотация

Features of forward diffracted Parametric X-Radiation (PXR) were investigated at experiments with the 855 MeV electron beam of the Mainz Microtron MAMI employing a 410 μm thick tungsten single crystal. Virtual photons from the electron field are diffracted by the (101̄) plane at a Bragg angle of 3.977°. Forward emitted radiation was analyzed at an energy of 40 keV with the (111) lattice planes of a flat silicon single crystal in Bragg geometry. Clear peak structures were observed in an angular scan of the tungsten single crystal. The results were analyzed with a model which describes forward diffracted PXR under real experimental conditions. The experiments show that forward diffracted PXR may be employed to diagnose bending radii of lattice planes in large area single crystals.

Язык оригиналаАнглийский
Название основной публикацииProceedings of SPIE - The International Society for Optical Engineering
Том6634
DOI
СостояниеОпубликовано - 2007
СобытиеInternational Conference on Charged and Neutral Particles Channeling: Phenomena II - Rome, Италия
Продолжительность: 3 июл 20067 июл 2006

Другое

ДругоеInternational Conference on Charged and Neutral Particles Channeling: Phenomena II
СтранаИталия
ГородRome
Период3.7.067.7.06

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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