Forming the defect structure in copper after exposure with high power microwave pulses

A. N. Didenko, E. V. Kozlov, Yu P. Sharkeev, A. S. Sulakshin, N. M. Filipenko, N. V. Girsova, S. V. Fortuna, Yu V. Medvedev

Результат исследований: Материалы для журналаСтатьярецензирование

Аннотация

Using the transmission electron microscopy the defect structures forming in near surface layers of polycrystal copper under the high power pulsed microwave influence have been investigated. Forming the stable dislocation structure in near surface layer of irradiated specimens was confirmed. Decrease of the surface layer specific resistance was established. Possible physical causes of the dislocations generation under pulsed microwave influence have been discussed.

Язык оригиналаАнглийский
Страницы (с-по)21-26
Число страниц6
ЖурналFizika i Khimiya Obrabotki Materialov
Номер выпуска5
СостояниеОпубликовано - сен 1997

ASJC Scopus subject areas

  • Materials Science(all)

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