Formation of a defect structure in a near surface α-Fe layer after high power ion beam exposure

A. D. Pogrebnyak, Yu P. Sharkeev, N. A. Makhmudov, G. V. Pushkareva, Sh A. Tukhtaev

Результат исследований: Материалы для журналаСтатьярецензирование

11 Цитирования (Scopus)

Аннотация

Results on the defect structure in α-Fe after high power ion beam exposure (HPIB) are presented. Using the positron annihilations technique, electron microscopy, microhardness measurements, and secondary ion mass spectrometry (SIMS), the formation of a dislocation structure, vacancy clusters (di-and trivacancies), and vacancy loops are revealed in the near surface layer. A correlation between the growing dislocation density and microhardness, on the one hand, and the increasing current density, on the other hand, can be observed. An element analysis performed using the SIMS technique did not show carbide, nitride, and oxide formation on the α-Fe surface. Increased surface and bulk microhardness are related to the formation of the total spectrum of defects in a modified layer. Results obtained using HPIB from a α-Fe surface are compared to results on single-axis-deformed α-Fe.

Язык оригиналаАнглийский
Страницы (с-по)119-130
Число страниц12
ЖурналPhysica Status Solidi (A) Applied Research
Том123
Номер выпуска1
СостояниеОпубликовано - янв 1991

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Подробные сведения о темах исследования «Formation of a defect structure in a near surface α-Fe layer after high power ion beam exposure». Вместе они формируют уникальный семантический отпечаток (fingerprint).

Цитировать