Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation

D. I. Vaisburd, T. A. Tukhfatulin

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Выдержка

High-current-density (HCD) electron beams of nanosecond pulse duration are applied for charge injection into various dielectrics to induce the critical electron emission from dielectric into vacuum. It is shown that critical electron emission induced by HCD injection of electrons arises in the form of gigantic single pulse, which is of peak value of 10-1000 A and delayed from injection one for 1-20 ns. Delay time depends on the current density of primary electron beam. The direct experimental evidence is obtained for intense generation of free electrons and holes in subsurface layer of a dielectric owing to Poole-Frenkel effect and impact ionization of traps in high electric field. And this process is considered to be the main reason for the sharp transition of the ordinary low-current-density field electron emission to the high-power one. The last is not uniform and accompanied by point explosions on the dielectric surface and ejections of ion plasmas from these points into vacuum. And these explosions are considered as the main reason for the transition of the field electron emission from dielectric (FEED) to the critical one. So the last is explosion electron emission of dielectrics (EEED). If the electron current to the emitting centers on the dielectric surface is maintained at the necessary value then the critical electron emission always causes the vacuum discharge between the dielectric surface and metallic collector. The mechanism of EEED is discussed using the computer simulation of the basic processes.

Язык оригиналаАнглийский
Название основной публикацииInternational Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV
РедакторыJ. Wetzer
Место публикацииPiscataway, NJ, United States
ИздательIEEE
Страницы166-169
Число страниц4
Том1
СостояниеОпубликовано - 1998
СобытиеProceedings of the 1998 18th Interantional Symposium on Discharges and Electrical Insulation in Vacuum. Part 1 (of 2) - Eindhoven, Neth
Продолжительность: 17 авг 199821 авг 1998

Другое

ДругоеProceedings of the 1998 18th Interantional Symposium on Discharges and Electrical Insulation in Vacuum. Part 1 (of 2)
ГородEindhoven, Neth
Период17.8.9821.8.98

Отпечаток

Electron emission
Electron beams
Current density
Computer simulation
Explosions
Vacuum
Electron transitions
Electrons
Charge injection
Impact ionization
Time delay
Electric fields
Plasmas
Ions

ASJC Scopus subject areas

  • Engineering(all)

Цитировать

Vaisburd, D. I., & Tukhfatulin, T. A. (1998). Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. В J. Wetzer (Ред.), International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV (Том 1, стр. 166-169). Piscataway, NJ, United States: IEEE.

Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. / Vaisburd, D. I.; Tukhfatulin, T. A.

International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. ред. / J. Wetzer. Том 1 Piscataway, NJ, United States : IEEE, 1998. стр. 166-169.

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Vaisburd, DI & Tukhfatulin, TA 1998, Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. в J Wetzer (ред.), International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. том. 1, IEEE, Piscataway, NJ, United States, стр. 166-169, Eindhoven, Neth, 17.8.98.
Vaisburd DI, Tukhfatulin TA. Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. В Wetzer J, редактор, International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Том 1. Piscataway, NJ, United States: IEEE. 1998. стр. 166-169
Vaisburd, D. I. ; Tukhfatulin, T. A. / Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. редактор / J. Wetzer. Том 1 Piscataway, NJ, United States : IEEE, 1998. стр. 166-169
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