Experimental and numerical investigation of two mechanisms underlying runaway electron beam formation

E. Kh Baksht, S. Ya Belomyttsev, A. G. Burachenko, V. V. Ryzhov, V. F. Tarasenko, Valery Alexandrovich Shklyaev

Результат исследований: Материалы для журнала › Статья › рецензирование

Аннотация

The electrical breakdown of a gas-filled diode with a highly nonuniform electric field is studied in the case when a 25-kV voltage pulse generates runaway electron beams with time-separated maxima of different duration behind anode foil. Experimental data are analyzed and numerically simulated using the PIC/MC code OOPIC-Pro. It is shown that, in terms of the model used, both beams arise at the cathode but their formation mechanisms differ. The first runaway electron beam no longer than 500 ps is attributed to the ionization mechanism; the second one, which may last several nanoseconds, is due to emission.

Язык оригинала	Английский
Страницы (с-по)	998-1002
Число страниц	5
Журнал	Technical Physics
Том	57
Номер выпуска	7
DOI	https://doi.org/10.1134/S1063784212070031
Состояние	Опубликовано - июл 2012
Опубликовано для внешнего пользования	Да

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Доступ к документу

10.1134/S1063784212070031

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Experimental and numerical investigation of two mechanisms underlying runaway electron beam formation. / Baksht, E. Kh; Belomyttsev, S. Ya; Burachenko, A. G.; Ryzhov, V. V.; Tarasenko, V. F.; Shklyaev, Valery Alexandrovich.

В: Technical Physics, Том 57, № 7, 07.2012, стр. 998-1002.

Результат исследований: Материалы для журнала › Статья › рецензирование

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AU - Ryzhov, V. V.

AU - Tarasenko, V. F.

AU - Shklyaev, Valery Alexandrovich

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