Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation

Ruslan Revovich Balokhonov, Sergei A. Martynov, Varvara A. Romanova, Ekaterina E. Batukhtina

    Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

    Аннотация

    The interfacial mechanisms of the stress concentration in materials with modified surface layers are investigated. A dynamic boundary-value problem in a plane-strain formulation is solved numerically by the finite-difference method. Serrated and wavy base material-surface layer interfaces observed experimentally are assigned explicitly in calculations. Two stages in the evolution of the stress concentration are found to occur due to irregular interfacial geometry. The stress concentration in near-interfacial regions turns out to depend on the sinusoidal wavy interface thickness and roughness.

    Язык оригиналаАнглийский
    Название основной публикацииAdvanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
    ИздательAmerican Institute of Physics Inc.
    Том1683
    ISBN (электронное издание)9780735413306
    DOI
    СостояниеОпубликовано - 27 окт 2015
    СобытиеInternational Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015 - Tomsk, Российская Федерация
    Продолжительность: 21 сен 201525 сен 2015

    Конференция

    КонференцияInternational Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015
    СтранаРоссийская Федерация
    ГородTomsk
    Период21.9.1525.9.15

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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  • Цитировать

    Balokhonov, RR., Martynov, S. A., Romanova, V. A., & Batukhtina, E. E. (2015). Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation. В Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures (Том 1683). [020018] American Institute of Physics Inc.. https://doi.org/10.1063/1.4932708