Estimation of a surface current distribution from 2D magnetic field measurements

T. A. Nguyen, P. Y. Joubert, S. Lefebvre, G. Chaplier

Результат исследований: Материалы для журналаСтатья

2 Цитирования (Scopus)

Выдержка

The paper reports on the estimation of the distribution of currents flowing in a metalized part, starting from two-dimensional maps of the magnetic field induced above the part, with the monitoring of power semiconductor dies in view. The estimation is obtained from the measured data by inverting a mesh-free modeling of the induced magnetic field. First inversion results of experimental data are presented and discussed.

Язык оригиналаАнглийский
Страницы (с-по)151-156
Число страниц6
ЖурналInternational Journal of Applied Electromagnetics and Mechanics
Том39
Номер выпуска1-4
DOI
СостояниеОпубликовано - 9 окт 2012
Опубликовано для внешнего пользованияДа

Отпечаток

Magnetic field measurement
current distribution
Magnetic fields
magnetic fields
mesh
inversions
Semiconductor materials
Monitoring

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Цитировать

Estimation of a surface current distribution from 2D magnetic field measurements. / Nguyen, T. A.; Joubert, P. Y.; Lefebvre, S.; Chaplier, G.

В: International Journal of Applied Electromagnetics and Mechanics, Том 39, № 1-4, 09.10.2012, стр. 151-156.

Результат исследований: Материалы для журналаСтатья

@article{3899c55fa27d42ecae1935c0145565e0,
title = "Estimation of a surface current distribution from 2D magnetic field measurements",
abstract = "The paper reports on the estimation of the distribution of currents flowing in a metalized part, starting from two-dimensional maps of the magnetic field induced above the part, with the monitoring of power semiconductor dies in view. The estimation is obtained from the measured data by inverting a mesh-free modeling of the induced magnetic field. First inversion results of experimental data are presented and discussed.",
keywords = "Current distribution, Hall effect sensor, inverse problem, mesh free modeling method, power semiconductor modules monitoring",
author = "Nguyen, {T. A.} and Joubert, {P. Y.} and S. Lefebvre and G. Chaplier",
year = "2012",
month = "10",
day = "9",
doi = "10.3233/JAE-2012-1455",
language = "English",
volume = "39",
pages = "151--156",
journal = "International Journal of Applied Electromagnetics and Mechanics",
issn = "1383-5416",
publisher = "IOS Press",
number = "1-4",

}

TY - JOUR

T1 - Estimation of a surface current distribution from 2D magnetic field measurements

AU - Nguyen, T. A.

AU - Joubert, P. Y.

AU - Lefebvre, S.

AU - Chaplier, G.

PY - 2012/10/9

Y1 - 2012/10/9

N2 - The paper reports on the estimation of the distribution of currents flowing in a metalized part, starting from two-dimensional maps of the magnetic field induced above the part, with the monitoring of power semiconductor dies in view. The estimation is obtained from the measured data by inverting a mesh-free modeling of the induced magnetic field. First inversion results of experimental data are presented and discussed.

AB - The paper reports on the estimation of the distribution of currents flowing in a metalized part, starting from two-dimensional maps of the magnetic field induced above the part, with the monitoring of power semiconductor dies in view. The estimation is obtained from the measured data by inverting a mesh-free modeling of the induced magnetic field. First inversion results of experimental data are presented and discussed.

KW - Current distribution

KW - Hall effect sensor

KW - inverse problem

KW - mesh free modeling method

KW - power semiconductor modules monitoring

UR - http://www.scopus.com/inward/record.url?scp=84867079937&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84867079937&partnerID=8YFLogxK

U2 - 10.3233/JAE-2012-1455

DO - 10.3233/JAE-2012-1455

M3 - Article

AN - SCOPUS:84867079937

VL - 39

SP - 151

EP - 156

JO - International Journal of Applied Electromagnetics and Mechanics

JF - International Journal of Applied Electromagnetics and Mechanics

SN - 1383-5416

IS - 1-4

ER -