Enhancement of the characteristic X-ray yield from oriented crystal irradiated by high-energy electrons

M. Andreyashkin, M. Inoue, H. Nakagawa, K. Yoshida, H. Okuno, R. Hamatsu, H. Kojima, M. Masuyama, T. Miyakawa, K. Umemori, A. Potylitsin, I. Vnukov, Y. Takashima, S. Anami, A. Enomoto, K. Furukawa, T. Kamitani, Y. Ogawa, S. Ohsawa

Результат исследований: Материалы для журналаСтатья

2 Цитирования (Scopus)

Аннотация

In this report, results of a measurement of characteristic X-ray (CXR) yields from oriented tungsten crystal targets irradiated by 600-1000 MeV electrons are presented. Characteristic X-rays from tungsten are measured with a Si(Li) semiconductor detector placed at the backward direction with respect to the incident electron beam. We have observed an enhancement of the X-ray yield due to the K-shell ionization when the crystal axis 〈1 1 1〉 is oriented along the beam. The ratio of the K-line yield from the oriented crystal to the one from the disoriented crystal is about 1.6-1.9 for the target thickness of 1.2 mm at the electron energy of 1000 MeV. For L-line yields the enhancement is not appreciable. We demonstrated a possibility of using the orientation dependence of the CXR as a mean of aligning the crystal axis at the channeling condition to the beam.

Язык оригиналаАнглийский
Страницы (с-по)142-148
Число страниц7
ЖурналNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Том173
Номер выпуска1
DOI
СостояниеОпубликовано - янв 2001

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

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  • Цитировать

    Andreyashkin, M., Inoue, M., Nakagawa, H., Yoshida, K., Okuno, H., Hamatsu, R., Kojima, H., Masuyama, M., Miyakawa, T., Umemori, K., Potylitsin, A., Vnukov, I., Takashima, Y., Anami, S., Enomoto, A., Furukawa, K., Kamitani, T., Ogawa, Y., & Ohsawa, S. (2001). Enhancement of the characteristic X-ray yield from oriented crystal irradiated by high-energy electrons. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 173(1), 142-148. https://doi.org/10.1016/S0168-583X(00)00387-6