Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces

Konstantin Arefyev, Vladimir Salnikov, Evguenya Lukyanova

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Выдержка

Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.

Язык оригиналаАнглийский
Название основной публикации8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004
Страницы188-190
Число страниц3
Том2
СостояниеОпубликовано - 2004
Событие8th Korea-Russia International Symposium on Science and Technology, KORUS 2004 - Tomsk, Российская Федерация
Продолжительность: 26 июн 20043 июл 2004

Другое

Другое8th Korea-Russia International Symposium on Science and Technology, KORUS 2004
СтранаРоссийская Федерация
ГородTomsk
Период26.6.043.7.04

Отпечаток

Surface treatment
Silicon
Hot Temperature

ASJC Scopus subject areas

  • Engineering(all)

Цитировать

Arefyev, K., Salnikov, V., & Lukyanova, E. (2004). Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. В 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004 (Том 2, стр. 188-190)

Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. / Arefyev, Konstantin; Salnikov, Vladimir; Lukyanova, Evguenya.

8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. Том 2 2004. стр. 188-190.

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

Arefyev, K, Salnikov, V & Lukyanova, E 2004, Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. в 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. том. 2, стр. 188-190, 8th Korea-Russia International Symposium on Science and Technology, KORUS 2004, Tomsk, Российская Федерация, 26.6.04.
Arefyev K, Salnikov V, Lukyanova E. Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. В 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. Том 2. 2004. стр. 188-190
Arefyev, Konstantin ; Salnikov, Vladimir ; Lukyanova, Evguenya. / Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. Том 2 2004. стр. 188-190
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