Efficient x-ray converters

V. I. Bespalov, V. V. Ryzhov, I. Yu Turchanovskiǐ

Результат исследований: Материалы для журналаСтатья

Выдержка

The Monte Carlo method is used to investigate the efficiency of conversion of the energy of low-energy electrons into x-ray radiation energy and it is shown that the characteristic radiation makes an important contribution to the energy absorbed by thin films undergoing radiation treatment. Selecting the converter material and thickness on the basis of the calculations can increase by a factor of 2-5 the radiation energy absorbed in thin films of semiconductor materials.

Язык оригиналаАнглийский
Страницы (с-по)20-21
Число страниц2
ЖурналTechnical Physics Letters
Том24
Номер выпуска1
СостояниеОпубликовано - янв 1998

Отпечаток

converters
radiation
x rays
energy
thin films
Monte Carlo method
electron energy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Цитировать

Efficient x-ray converters. / Bespalov, V. I.; Ryzhov, V. V.; Turchanovskiǐ, I. Yu.

В: Technical Physics Letters, Том 24, № 1, 01.1998, стр. 20-21.

Результат исследований: Материалы для журналаСтатья

Bespalov, VI, Ryzhov, VV & Turchanovskiǐ, IY 1998, 'Efficient x-ray converters', Technical Physics Letters, том. 24, № 1, стр. 20-21.
Bespalov VI, Ryzhov VV, Turchanovskiǐ IY. Efficient x-ray converters. Technical Physics Letters. 1998 Янв.;24(1):20-21.
Bespalov, V. I. ; Ryzhov, V. V. ; Turchanovskiǐ, I. Yu. / Efficient x-ray converters. В: Technical Physics Letters. 1998 ; Том 24, № 1. стр. 20-21.
@article{b710d499c87142a580c483a4e9b7b72b,
title = "Efficient x-ray converters",
abstract = "The Monte Carlo method is used to investigate the efficiency of conversion of the energy of low-energy electrons into x-ray radiation energy and it is shown that the characteristic radiation makes an important contribution to the energy absorbed by thin films undergoing radiation treatment. Selecting the converter material and thickness on the basis of the calculations can increase by a factor of 2-5 the radiation energy absorbed in thin films of semiconductor materials.",
author = "Bespalov, {V. I.} and Ryzhov, {V. V.} and Turchanovskiǐ, {I. Yu}",
year = "1998",
month = "1",
language = "English",
volume = "24",
pages = "20--21",
journal = "Technical Physics Letters",
issn = "1063-7850",
publisher = "Maik Nauka-Interperiodica Publishing",
number = "1",

}

TY - JOUR

T1 - Efficient x-ray converters

AU - Bespalov, V. I.

AU - Ryzhov, V. V.

AU - Turchanovskiǐ, I. Yu

PY - 1998/1

Y1 - 1998/1

N2 - The Monte Carlo method is used to investigate the efficiency of conversion of the energy of low-energy electrons into x-ray radiation energy and it is shown that the characteristic radiation makes an important contribution to the energy absorbed by thin films undergoing radiation treatment. Selecting the converter material and thickness on the basis of the calculations can increase by a factor of 2-5 the radiation energy absorbed in thin films of semiconductor materials.

AB - The Monte Carlo method is used to investigate the efficiency of conversion of the energy of low-energy electrons into x-ray radiation energy and it is shown that the characteristic radiation makes an important contribution to the energy absorbed by thin films undergoing radiation treatment. Selecting the converter material and thickness on the basis of the calculations can increase by a factor of 2-5 the radiation energy absorbed in thin films of semiconductor materials.

UR - http://www.scopus.com/inward/record.url?scp=0032342357&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032342357&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0032342357

VL - 24

SP - 20

EP - 21

JO - Technical Physics Letters

JF - Technical Physics Letters

SN - 1063-7850

IS - 1

ER -