Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon

O. V. Bogdanov, K. B. Korotchenko, Yu L. Pivovarov

Результат исследования: Материалы для журнала › Статья

Аннотация

It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

Язык оригинала	Английский
Страницы (с... по...)	290-296
Количество страниц	7
Журнал	Journal of Surface Investigation
Том	2
Номер выпуска	2
DOI	https://doi.org/10.1134/S1027451008020249
Статус публикации	Опубликовано - апр 2008

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ASJC Scopus subject areas

Surfaces, Coatings and Films

Цитировать

Bogdanov, O. V., Korotchenko, K. B., & Pivovarov, Y. L. (2008). Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon. Journal of Surface Investigation, 2(2), 290-296. https://doi.org/10.1134/S1027451008020249

Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon. / Bogdanov, O. V.; Korotchenko, K. B.; Pivovarov, Yu L.

В: Journal of Surface Investigation, Том 2, № 2, 04.2008, стр. 290-296.

Результат исследования: Материалы для журнала › Статья

@article{7fabef7b60df4642a9c0c273350900ba,

title = "Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon",

abstract = "It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.",

author = "Bogdanov, {O. V.} and Korotchenko, {K. B.} and Pivovarov, {Yu L.}",

year = "2008",

month = "4",

doi = "10.1134/S1027451008020249",

language = "English",

volume = "2",

pages = "290--296",

journal = "Journal of Surface Investigation",

issn = "1027-4510",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "2",

}

TY - JOUR

T1 - Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon

AU - Bogdanov, O. V.

AU - Korotchenko, K. B.

AU - Pivovarov, Yu L.

PY - 2008/4

Y1 - 2008/4

N2 - It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

AB - It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

UR - http://www.scopus.com/inward/record.url?scp=58449123567&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=58449123567&partnerID=8YFLogxK

U2 - 10.1134/S1027451008020249

DO - 10.1134/S1027451008020249

M3 - Article

AN - SCOPUS:58449123567

VL - 2

SP - 290

EP - 296

JO - Journal of Surface Investigation

JF - Journal of Surface Investigation

SN - 1027-4510

IS - 2

ER -

Доступ к документу

10.1134/S1027451008020249