Аннотация
Two digital devices were developed to enhance the possibilities of high speed thermovisers in thermal nondestructive testing: digital thermograms processor with a memory DTPM-1,2 and microprocessor unit MPT-1. These units could be used either in a single variant or together with a personal computer to increase the reliability of inner defects detection in solids against the specific noise.Principles of thermal tomography are discussed.
Язык оригинала | Английский |
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Страницы (с-по) | 642-645 |
Число страниц | 4 |
Журнал | Proceedings of SPIE - The International Society for Optical Engineering |
Том | 1032 |
DOI | |
Состояние | Опубликовано - 7 июн 1989 |
Событие | 18th International Congress on High Speed Photography and Photonics 1988 - Xi'an, Китай Продолжительность: 28 авг 1988 → 2 сен 1988 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering