Determination of the composition of ion-implanted MgO surface layers by Rutherford and resonant backscattering of ions

V. M. Zavodchikov, A. P. Kobzev, Yu Yu Kryuchkov, V. F. Pichugin, Valentina Victorovna Sokhoreva, T. S. Frangul'yan

Результат исследований: Материалы для журнала › Статья

Язык оригинала	Английский
Страницы (с-по)	8-9
Число страниц	2
Журнал	Technical Physics Letters
Том	22
Номер выпуска	1
Состояние	Опубликовано - янв 1996

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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Zavodchikov, V. M., Kobzev, A. P., Kryuchkov, Y. Y., Pichugin, V. F., Sokhoreva, V. V., & Frangul'yan, T. S. (1996). Determination of the composition of ion-implanted MgO surface layers by Rutherford and resonant backscattering of ions. Technical Physics Letters, 22(1), 8-9.

Determination of the composition of ion-implanted MgO surface layers by Rutherford and resonant backscattering of ions. / Zavodchikov, V. M.; Kobzev, A. P.; Kryuchkov, Yu Yu ; Pichugin, V. F.; Sokhoreva, Valentina Victorovna; Frangul'yan, T. S.

В: Technical Physics Letters, Том 22, № 1, 01.1996, стр. 8-9.

Результат исследований: Материалы для журнала › Статья

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