Determination of light trace elements in surface layers

R. P. Meshcheryakov, I. P. Chernov, A. N. Oblivantsev, B. I. Kuznetsov, G. I. Tronov, A. G. Rybasov

Результат исследования: Материалы для журналаСтатья

1 Цитирования (Scopus)

Аннотация

A method is presented for determining the concentration of light elements in a surface layer up to 15 μm deep, utilizing the anomalous increase in elastic scattering cross-sectional area when high-energy alpha-particles are scattered by light nuclei through large angles. For the separation of the short-lived nuclide17F, isotope-exchange between the solid and liquid phases was applied.

Язык оригиналаАнглийский
Страницы (с... по...)427-438
Количество страниц12
ЖурналJournal of Radioanalytical Chemistry
Том16
Номер выпуска2
DOI
Статус публикацииОпубликовано - сен 1973

    Fingerprint

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging
  • Molecular Medicine

Цитировать

Meshcheryakov, R. P., Chernov, I. P., Oblivantsev, A. N., Kuznetsov, B. I., Tronov, G. I., & Rybasov, A. G. (1973). Determination of light trace elements in surface layers. Journal of Radioanalytical Chemistry, 16(2), 427-438. https://doi.org/10.1007/BF02514173