Computer system for measurement of high voltage signal during plasma process in solution

Результат исследования: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

This paper presents both hardware and software of a system for measurement of high-voltage signal with high resolution. The distinctive feature of the system is its application for investigation of the high-voltage plasma processes in solutions which are characterized by the pulse voltage within the range from 100 V to 3 kV and by the pulse duration from a few to hundreds microseconds. The system is portable and consists of the high-voltage dividers, signal level shift unit, oscilloscope, and computer with software. Structure and main principles of operation are described. Its technical and metrological parameters are given.

Язык оригиналаАнглийский
Заголовок главной публикации16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc.
Страницы254-257
Количество страниц4
Статус публикацииОпубликовано - 2008
Событие16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session - Florence, Италия
Длительность: 22 сен 200824 сен 2008

Другое

Другое16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session
СтранаИталия
ГородFlorence
Период22.9.0824.9.08

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Цитировать

Borikov, V. N. (2008). Computer system for measurement of high voltage signal during plasma process in solution. В 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc. (стр. 254-257)