An experimental investigation was performed on the stopping of charge injection in dielectrics irradiated by mid-energy electron flux. For relatively thick layers of LiF, PMMA, fused SiO2 and phosphate glass the phenomenon of annular current channel formation was observed when the electron beam had an energy below 0.1 MeV. A simple model of beam spreading is developed and the limiting conditions are established for the effect described.

Язык оригиналаАнглийский
Страницы (с-по)341-347
Число страниц7
ЖурналJournal of Electrostatics
Номер выпуска3
СостояниеОпубликовано - 1988

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Materials Chemistry
  • Physics and Astronomy(all)
  • Surfaces and Interfaces

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