Change of electron injection in irradiated dielectrics caused by surface charging

Аннотация

The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.

Язык оригинала	Английский
Страницы (с-по)	37-43
Число страниц	7
Журнал	Journal of Electrostatics
Том	21
Номер выпуска	1
DOI	https://doi.org/10.1016/0304-3886(88)90017-4
Состояние	Опубликовано - 1988

ASJC Scopus subject areas

Electrical and Electronic Engineering
Materials Science(all)
Materials Chemistry
Physics and Astronomy(all)
Surfaces and Interfaces

Доступ к документу

10.1016/0304-3886(88)90017-4

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Цитировать

Starodubtsev, V. A., Fursa, T. V., & Erofeeva, GV. (1988). Change of electron injection in irradiated dielectrics caused by surface charging. Journal of Electrostatics, 21(1), 37-43. https://doi.org/10.1016/0304-3886(88)90017-4

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abstract = "The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.",

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AB - The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.

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