Breakdown strength of two-layer dielectrics

S. M. Lebedev, O. S. Gefle, Yu P. Pokholkov, V. I. Chichikin

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

5 Цитирования (Scopus)


In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (Eb) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tanδ in low and high field were obtained. We suppose that the discovered changes in Eb and tanδ with the changing ξ are probably caused by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.

Язык оригиналаАнглийский
Название основной публикацииIEE Conference Publication
Место публикацииStevenage, United Kingdom
ISBN (печатное издание)0852967195
СостояниеОпубликовано - 1999
СобытиеProceedings of the 1999 11th International Symposium on 'High Voltage Engineering' (ish99) - London, UK
Продолжительность: 23 авг 199927 авг 1999


ДругоеProceedings of the 1999 11th International Symposium on 'High Voltage Engineering' (ish99)
ГородLondon, UK

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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