Аннотация
This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.
| Язык оригинала | Английский |
|---|---|
| Номер статьи | 012047 |
| Журнал | Journal of Physics: Conference Series |
| Том | 1499 |
| Номер выпуска | 1 |
| DOI | |
| Состояние | Опубликовано - 11 июн 2020 |
| Событие | 8th International Conference on Actual Trends in Radiophysics - Tomsk, Российская Федерация Продолжительность: 1 окт 2019 → 4 окт 2019 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Цитировать
Vasiliev, I. M., Soldatov, A. I., Dementiev, A. A., Soldatov, A. A., & Abouellaill, A. (2020). Automatic device for testing thermal resistance with thermoelectric effect. Journal of Physics: Conference Series, 1499(1), [012047]. https://doi.org/10.1088/1742-6596/1499/1/012047