Angular distribution of diffracted x rays from (111) channeled electrons in Si: The effect of the band structure of energy levels

O. V. Bogdanov, K. B. Korotchenko, Yu L. Pivovarov

Результат исследований: Материалы для журнала › Статья › рецензирование

Аннотация

It has been shown that the inclusion of the band structure of the energy levels of channeled electrons qualitatively changes the angular distributions of x rays at the Bragg angles, which can be useful for the experimental detection of the effect.

Язык оригинала	Английский
Страницы (с-по)	555-559
Число страниц	5
Журнал	JETP Letters
Том	85
Номер выпуска	11
DOI	https://doi.org/10.1134/S0021364007110069
Состояние	Опубликовано - авг 2007

ASJC Scopus subject areas

Physics and Astronomy(all)

Доступ к документу

10.1134/S0021364007110069

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Цитировать

Angular distribution of diffracted x rays from (111) channeled electrons in Si : The effect of the band structure of energy levels. / Bogdanov, O. V.; Korotchenko, K. B.; Pivovarov, Yu L.

В: JETP Letters, Том 85, № 11, 08.2007, стр. 555-559.

Результат исследований: Материалы для журнала › Статья › рецензирование

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