An ellipsometric study of polyamide and polyimide langmuir-blodgett films

S. N. Shtykov, B. N. Klimov, D. A. Gorin, M. A. Gets'man, K. E. Pankin

Результат исследований: Материалы для журналаСтатья

1 Цитирования (Scopus)

Аннотация

Ellipsometry in conjunction with the Ψ-Δ-nomogram method was used to determine the thickness per monolayer and refractive index of Langmuir-Blodgett (LB) films prepared from dimethyloctadecylammonium salt of polyamide acid (S) and polyimide films obtained by the thermal imidization of S. Before imidization, the thickness per monolayer and refractive index of the LB film were 1.8 ± 0.2 nm and 1.500 ± 0.016, respectively; after imidization, these parameters changed to 0.5 ± 0.1 nm and 1.685 ± 0.038. The refractive index of the polyamide LB film was found to increase with the number of monolayers.

Язык оригиналаАнглийский
Страницы (с-по)416-419
Число страниц4
ЖурналRussian Journal of Physical Chemistry A
Том78
Номер выпуска3
СостояниеОпубликовано - мар 2004
Опубликовано для внешнего пользованияДа

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry

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  • Цитировать

    Shtykov, S. N., Klimov, B. N., Gorin, D. A., Gets'man, M. A., & Pankin, K. E. (2004). An ellipsometric study of polyamide and polyimide langmuir-blodgett films. Russian Journal of Physical Chemistry A, 78(3), 416-419.