Ageing test results of low voltage MOSFET modules for electrical vehicles

Laurent Dupont, Stéphane Lefebvre, Mounira Bouaroudj, Zoubir Khatir, Jean Claude Faugières, Francis Emorine

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

14 Цитирования (Scopus)

Аннотация

HEV is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive / active thermal cycle ageing must be evaluated. Authors present first results on ageing and failure modes for a 75V/350A MOSFET module from a low voltage / cycled DC current test bench. Bond wires are used for electrical connections between dies and between dies and DCB substrates. For this kind of low voltage and high current module, the main lifetime limitation at high temperature is related to the electric connexions.

Язык оригиналаАнглийский
Название основной публикации2007 European Conference on Power Electronics and Applications, EPE
DOI
СостояниеОпубликовано - 1 дек 2007
Опубликовано для внешнего пользованияДа
Событие2007 European Conference on Power Electronics and Applications, EPE - Aalborg, Дания
Продолжительность: 2 сен 20075 сен 2007

Серия публикаций

Название2007 European Conference on Power Electronics and Applications, EPE

Конференция

Конференция2007 European Conference on Power Electronics and Applications, EPE
СтранаДания
ГородAalborg
Период2.9.075.9.07

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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  • Цитировать

    Dupont, L., Lefebvre, S., Bouaroudj, M., Khatir, Z., Faugières, J. C., & Emorine, F. (2007). Ageing test results of low voltage MOSFET modules for electrical vehicles. В 2007 European Conference on Power Electronics and Applications, EPE [4417433] (2007 European Conference on Power Electronics and Applications, EPE). https://doi.org/10.1109/EPE.2007.4417433