Additional anodic peak in the stripping voltammetry of the platinum-metal binary systems

N. A. Kolpakova, N. V. Ivanova, V. A. Nevostruev, V. M. Pugachev

Результат исследования: Материалы для книги/типы отчетовМатериалы для конференции

Аннотация

The influence of platinum on the electoreduction and electrooxidation of a number of metals (Hg, Pb, Cu and Cd - metal) on glassy carbon surface was investigated. In this way, electrodeposition of the metal in the presence of platinum result in it redistribution between the different electrocraystllization centers on the electrode surface (metal centers or platinum centers), which leads to the formation of stripping peaks at different potential during the anodic scan. The solid solutions in the case of Pt-Cu, Pt-Pb, Pt-Cd binary systems and the intermetallic compound with the composition PtHg4 in the case of Pt-Hg were discovered.

Язык оригиналаАнглийский
Заголовок главной публикации5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001
ИздательInstitute of Electrical and Electronics Engineers Inc.
Страницы140-142
Количество страниц3
Том2
ISBN (печатная версия)0780370082, 9780780370081
DOI
Статус публикацииОпубликовано - 2001
Событие5th Korea-Russia International Symposium on Science and Technology, KORUS 2001 - Tomsk, Российская Федерация
Длительность: 26 июн 20013 июл 2001

Другое

Другое5th Korea-Russia International Symposium on Science and Technology, KORUS 2001
СтранаРоссийская Федерация
ГородTomsk
Период26.6.013.7.01

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ASJC Scopus subject areas

  • Clinical Biochemistry
  • Computer Networks and Communications
  • Biotechnology
  • Civil and Structural Engineering
  • Mechanics of Materials
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Surfaces, Coatings and Films

Цитировать

Kolpakova, N. A., Ivanova, N. V., Nevostruev, V. A., & Pugachev, V. M. (2001). Additional anodic peak in the stripping voltammetry of the platinum-metal binary systems. В 5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001 (Том 2, стр. 140-142). [975206] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/KORUS.2001.975206