Acoustic emission as method of chatter detection in cutting

N. N. Shamarin, A. V. Filippov, S. Yu Tarasov, O. A. Podgornyh, E. O. Filippova, A. V. Vorontsov

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

2 Цитирования (Scopus)

Аннотация

The possibility of using the acoustic emission method for monitoring the cutting process mode is considered. The influence of mechanical chatter in the technological system on the parameters of acoustic emission signals has been experimentally revealed. It is established that a short-term drop in the acoustic emission spectral power is observed in the transition from a steady to a chatter cutting regime. In the region of high-amplitude vibrations, the time dependencies of median frequency of the AE decreases, while that of the spectral power increases sharply.

Язык оригиналаАнглийский
Название основной публикацииProceedings of the Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
РедакторыVasily M. Fomin, Victor E. Panin, Sergey G. Psakhie
ИздательAmerican Institute of Physics Inc.
Том2051
ISBN (электронное издание)9780735417779
DOI
СостояниеОпубликовано - 12 дек 2018
СобытиеInternational Symposium on Hierarchical Materials: Development and Applications for New Technologies and Reliable Structures 2018 - Tomsk, Российская Федерация
Продолжительность: 1 окт 20185 окт 2018

Конференция

КонференцияInternational Symposium on Hierarchical Materials: Development and Applications for New Technologies and Reliable Structures 2018
СтранаРоссийская Федерация
ГородTomsk
Период1.10.185.10.18

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Цитировать

    Shamarin, N. N., Filippov, A. V., Tarasov, S. Y., Podgornyh, O. A., Filippova, E. O., & Vorontsov, A. V. (2018). Acoustic emission as method of chatter detection in cutting. В V. M. Fomin, V. E. Panin, & S. G. Psakhie (Ред.), Proceedings of the Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures (Том 2051). [020276] American Institute of Physics Inc.. https://doi.org/10.1063/1.5083519