A novel data processing algorithm in thermal property measurement and defect detection by using one-sided active infrared thermography

Результат исследований: Материалы для книги/типы отчетовМатериалы для конференции

3 Цитирования (Scopus)

Аннотация

The proposed algorithm is based on the analysis of an artificial front-surface pixel-based function which includes temperature and time. This function experiences certain extremums, and the corresponding times can be used for determining thermal diffusivity by the formula similar to the known Parker expression. In thermal NDT, such approach being applied to defect areas, provides diffusivity variations which can be used for the evaluation of defect severity in a particular specimen. In this study, both the theoretical basis and the some experimental implementations of the proposed data processing algorithm have been explored to illustrate its validity in thermal properties measurement and thermal NDT, including thermal tomography.

Язык оригиналаАнглийский
Название основной публикацииProceedings of SPIE - The International Society for Optical Engineering
ИздательSPIE
Том9485
ISBN (печатное издание)9781628416015
DOI
СостояниеОпубликовано - 2015
СобытиеSPIE ThermoSense Conference: Thermal Infrared Applications XXXVII - Baltimore, Соединенные Штаты Америки
Продолжительность: 20 апр 201523 апр 2015

Другое

ДругоеSPIE ThermoSense Conference: Thermal Infrared Applications XXXVII
СтранаСоединенные Штаты Америки
ГородBaltimore
Период20.4.1523.4.15

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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