A double-frame nanosecond soft X-ray backlighting system based on X-pinches

Аннотация

The operation of a double-frame soft X-ray backlighting system on the basis of two table-top pulsed power generators and X-pinches is described. The system allows one to obtain two backlighting frames of a fast process with a nanosecond exposure (2-3 ns), a micrometer spatial resolution, and an adjustable delay between the frames. Backlighting registration of electrically exploding single aluminum wires was performed in the spectral range hν > 0.8 keV of the backlighting source using the double-frame system. The jitter time between X-ray pulses was within ±18 ns.

Язык оригинала	Английский
Страницы (с-по)	66-71
Число страниц	6
Журнал	Instruments and Experimental Techniques
Том	56
Номер выпуска	1
DOI	https://doi.org/10.1134/S0020441213010028
Состояние	Опубликовано - 1 янв 2013
Опубликовано для внешнего пользования	Да

ASJC Scopus subject areas

Instrumentation

Доступ к документу

10.1134/S0020441213010028

Fingerprint Подробные сведения о темах исследования «A double-frame nanosecond soft X-ray backlighting system based on X-pinches». Вместе они формируют уникальный семантический отпечаток (fingerprint).

Цитировать

Artyomov, A. P., Fedyunin, A. V., Chaikovsky, S. A., Zhigalin, A. S., Oreshkin, V. I., Ratakhin, N. A., & Rousskikh, A. G. (2013). A double-frame nanosecond soft X-ray backlighting system based on X-pinches. Instruments and Experimental Techniques, 56(1), 66-71. https://doi.org/10.1134/S0020441213010028

A double-frame nanosecond soft X-ray backlighting system based on X-pinches. / Artyomov, A. P.; Fedyunin, A. V.; Chaikovsky, S. A.; Zhigalin, A. S.; Oreshkin, V. I.; Ratakhin, N. A.; Rousskikh, A. G.

В: Instruments and Experimental Techniques, Том 56, № 1, 01.01.2013, стр. 66-71.

Результат исследований: Материалы для журнала › Статья

@article{932cd4e4972f483f886050f9ce18e5c9,

title = "A double-frame nanosecond soft X-ray backlighting system based on X-pinches",

abstract = "The operation of a double-frame soft X-ray backlighting system on the basis of two table-top pulsed power generators and X-pinches is described. The system allows one to obtain two backlighting frames of a fast process with a nanosecond exposure (2-3 ns), a micrometer spatial resolution, and an adjustable delay between the frames. Backlighting registration of electrically exploding single aluminum wires was performed in the spectral range hν > 0.8 keV of the backlighting source using the double-frame system. The jitter time between X-ray pulses was within ±18 ns.",

author = "Artyomov, {A. P.} and Fedyunin, {A. V.} and Chaikovsky, {S. A.} and Zhigalin, {A. S.} and Oreshkin, {V. I.} and Ratakhin, {N. A.} and Rousskikh, {A. G.}",

year = "2013",

month = jan,

day = "1",

doi = "10.1134/S0020441213010028",

language = "English",

volume = "56",

pages = "66--71",

journal = "Instruments and Experimental Techniques",

issn = "0020-4412",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "1",

}

TY - JOUR

T1 - A double-frame nanosecond soft X-ray backlighting system based on X-pinches

AU - Artyomov, A. P.

AU - Fedyunin, A. V.

AU - Chaikovsky, S. A.

AU - Zhigalin, A. S.

AU - Oreshkin, V. I.

AU - Ratakhin, N. A.

AU - Rousskikh, A. G.

PY - 2013/1/1

Y1 - 2013/1/1

N2 - The operation of a double-frame soft X-ray backlighting system on the basis of two table-top pulsed power generators and X-pinches is described. The system allows one to obtain two backlighting frames of a fast process with a nanosecond exposure (2-3 ns), a micrometer spatial resolution, and an adjustable delay between the frames. Backlighting registration of electrically exploding single aluminum wires was performed in the spectral range hν > 0.8 keV of the backlighting source using the double-frame system. The jitter time between X-ray pulses was within ±18 ns.

AB - The operation of a double-frame soft X-ray backlighting system on the basis of two table-top pulsed power generators and X-pinches is described. The system allows one to obtain two backlighting frames of a fast process with a nanosecond exposure (2-3 ns), a micrometer spatial resolution, and an adjustable delay between the frames. Backlighting registration of electrically exploding single aluminum wires was performed in the spectral range hν > 0.8 keV of the backlighting source using the double-frame system. The jitter time between X-ray pulses was within ±18 ns.

UR - http://www.scopus.com/inward/record.url?scp=84874063046&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84874063046&partnerID=8YFLogxK

U2 - 10.1134/S0020441213010028

DO - 10.1134/S0020441213010028

M3 - Article

AN - SCOPUS:84874063046

VL - 56

SP - 66

EP - 71

JO - Instruments and Experimental Techniques

JF - Instruments and Experimental Techniques

SN - 0020-4412

IS - 1

ER -