A double-frame nanosecond soft X-ray backlighting system based on X-pinches

A. P. Artyomov, A. V. Fedyunin, S. A. Chaikovsky, A. S. Zhigalin, V. I. Oreshkin, N. A. Ratakhin, A. G. Rousskikh

Результат исследований: Материалы для журнала › Статья › рецензирование

Аннотация

The operation of a double-frame soft X-ray backlighting system on the basis of two table-top pulsed power generators and X-pinches is described. The system allows one to obtain two backlighting frames of a fast process with a nanosecond exposure (2-3 ns), a micrometer spatial resolution, and an adjustable delay between the frames. Backlighting registration of electrically exploding single aluminum wires was performed in the spectral range hν > 0.8 keV of the backlighting source using the double-frame system. The jitter time between X-ray pulses was within ±18 ns.

Язык оригинала	Английский
Страницы (с-по)	66-71
Число страниц	6
Журнал	Instruments and Experimental Techniques
Том	56
Номер выпуска	1
DOI	https://doi.org/10.1134/S0020441213010028
Состояние	Опубликовано - 1 янв 2013
Опубликовано для внешнего пользования	Да

ASJC Scopus subject areas

Instrumentation

Доступ к документу

10.1134/S0020441213010028

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A double-frame nanosecond soft X-ray backlighting system based on X-pinches. / Artyomov, A. P.; Fedyunin, A. V.; Chaikovsky, S. A.; Zhigalin, A. S.; Oreshkin, V. I.; Ratakhin, N. A.; Rousskikh, A. G.

В: Instruments and Experimental Techniques, Том 56, № 1, 01.01.2013, стр. 66-71.

Результат исследований: Материалы для журнала › Статья › рецензирование

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AU - Ratakhin, N. A.

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