Abstract
The paper presents the results of TEM and optical transparency measurements on ZnGeP 2 crystals grown by the vertical Bridgman technique from melts of differing compositions. The TEM study reveals the presence of nano-dimensional precipitates of second phases: zinc and Zn xP y precipitation occurs in material grown from Zn-rich melts and GeP from the deficient melts. The precipitation is associated with cooling through the retrograde solidus at a temperature below the melting point. Elastic stress fields are also observed. The relationships between the precipitates and elastic stresses and between precipitation and optical losses are investigated.
Original language | English |
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Title of host publication | Materials Research Society Symposium - Proceedings |
Publisher | Materials Research Society |
Pages | 457-463 |
Number of pages | 7 |
Volume | 607 |
Publication status | Published - 2000 |
Event | The 1999 MRS Fall Meeting - Symposium OO 'Infrared Applications of Semiconductors III' - Boston, MA, USA Duration: 29 Nov 1999 → 2 Dec 1999 |
Other
Other | The 1999 MRS Fall Meeting - Symposium OO 'Infrared Applications of Semiconductors III' |
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City | Boston, MA, USA |
Period | 29.11.99 → 2.12.99 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials