X-ray Tomographic System Behavior Prediction Based on a Mathematical Model

S. S. Baus, Ludmila Anatolievna Red'ko, M. N. Yanushevskaya

Research output: Contribution to journalArticle

Abstract

There appear certain challenges in defining the dependence of the X-ray radiation intensity change in passing through the material (as fixed by the detector) conditioned by various parameters of an X-ray optical system while designing new modifications of X-ray tomographs. At present, this problem is experimentally solved by selection of voltage corresponding parameter values on an X-ray tube with thickness and type of the studied material considered. To reduce the design time and complexity, a mathematical model of parameter behavior is required to characterize the X-ray optical system in the major working range of values. The present paper investigates the X-ray optical system behavior using methods of mathematical statistics. A regression model has been obtained which matches the change of the X-ray intensity value to the intensity in the X-ray tube. The research has defined the further study direction of X -ray optical system parameters.

Original languageEnglish
Article number012016
JournalIOP Conference Series: Materials Science and Engineering
Volume189
Issue number1
DOIs
Publication statusPublished - 18 Apr 2017

Fingerprint

Mathematical models
X rays
Optical systems
X ray tubes
Statistical methods
Detectors
Radiation
Electric potential

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

Cite this

X-ray Tomographic System Behavior Prediction Based on a Mathematical Model. / Baus, S. S.; Red'ko, Ludmila Anatolievna; Yanushevskaya, M. N.

In: IOP Conference Series: Materials Science and Engineering, Vol. 189, No. 1, 012016, 18.04.2017.

Research output: Contribution to journalArticle

@article{a5ad1205aca746539d246d590213b151,
title = "X-ray Tomographic System Behavior Prediction Based on a Mathematical Model",
abstract = "There appear certain challenges in defining the dependence of the X-ray radiation intensity change in passing through the material (as fixed by the detector) conditioned by various parameters of an X-ray optical system while designing new modifications of X-ray tomographs. At present, this problem is experimentally solved by selection of voltage corresponding parameter values on an X-ray tube with thickness and type of the studied material considered. To reduce the design time and complexity, a mathematical model of parameter behavior is required to characterize the X-ray optical system in the major working range of values. The present paper investigates the X-ray optical system behavior using methods of mathematical statistics. A regression model has been obtained which matches the change of the X-ray intensity value to the intensity in the X-ray tube. The research has defined the further study direction of X -ray optical system parameters.",
author = "Baus, {S. S.} and Ludmila Anatolievna Red'ko and Yanushevskaya, {M. N.}",
year = "2017",
month = "4",
day = "18",
doi = "10.1088/1757-899X/189/1/012016",
language = "English",
volume = "189",
journal = "IOP Conference Series: Materials Science and Engineering",
issn = "1757-8981",
publisher = "IOP Publishing Ltd.",
number = "1",

}

TY - JOUR

T1 - X-ray Tomographic System Behavior Prediction Based on a Mathematical Model

AU - Baus, S. S.

AU - Red'ko, Ludmila Anatolievna

AU - Yanushevskaya, M. N.

PY - 2017/4/18

Y1 - 2017/4/18

N2 - There appear certain challenges in defining the dependence of the X-ray radiation intensity change in passing through the material (as fixed by the detector) conditioned by various parameters of an X-ray optical system while designing new modifications of X-ray tomographs. At present, this problem is experimentally solved by selection of voltage corresponding parameter values on an X-ray tube with thickness and type of the studied material considered. To reduce the design time and complexity, a mathematical model of parameter behavior is required to characterize the X-ray optical system in the major working range of values. The present paper investigates the X-ray optical system behavior using methods of mathematical statistics. A regression model has been obtained which matches the change of the X-ray intensity value to the intensity in the X-ray tube. The research has defined the further study direction of X -ray optical system parameters.

AB - There appear certain challenges in defining the dependence of the X-ray radiation intensity change in passing through the material (as fixed by the detector) conditioned by various parameters of an X-ray optical system while designing new modifications of X-ray tomographs. At present, this problem is experimentally solved by selection of voltage corresponding parameter values on an X-ray tube with thickness and type of the studied material considered. To reduce the design time and complexity, a mathematical model of parameter behavior is required to characterize the X-ray optical system in the major working range of values. The present paper investigates the X-ray optical system behavior using methods of mathematical statistics. A regression model has been obtained which matches the change of the X-ray intensity value to the intensity in the X-ray tube. The research has defined the further study direction of X -ray optical system parameters.

UR - http://www.scopus.com/inward/record.url?scp=85018385371&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85018385371&partnerID=8YFLogxK

U2 - 10.1088/1757-899X/189/1/012016

DO - 10.1088/1757-899X/189/1/012016

M3 - Article

VL - 189

JO - IOP Conference Series: Materials Science and Engineering

JF - IOP Conference Series: Materials Science and Engineering

SN - 1757-8981

IS - 1

M1 - 012016

ER -