Abstract
There appear certain challenges in defining the dependence of the X-ray radiation intensity change in passing through the material (as fixed by the detector) conditioned by various parameters of an X-ray optical system while designing new modifications of X-ray tomographs. At present, this problem is experimentally solved by selection of voltage corresponding parameter values on an X-ray tube with thickness and type of the studied material considered. To reduce the design time and complexity, a mathematical model of parameter behavior is required to characterize the X-ray optical system in the major working range of values. The present paper investigates the X-ray optical system behavior using methods of mathematical statistics. A regression model has been obtained which matches the change of the X-ray intensity value to the intensity in the X-ray tube. The research has defined the further study direction of X -ray optical system parameters.
| Original language | English |
|---|---|
| Article number | 012016 |
| Journal | IOP Conference Series: Materials Science and Engineering |
| Volume | 189 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 18 Apr 2017 |
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ASJC Scopus subject areas
- Materials Science(all)
- Engineering(all)
Cite this
X-ray Tomographic System Behavior Prediction Based on a Mathematical Model. / Baus, S. S.; Red'ko, Ludmila Anatolievna; Yanushevskaya, M. N.
In: IOP Conference Series: Materials Science and Engineering, Vol. 189, No. 1, 012016, 18.04.2017.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - X-ray Tomographic System Behavior Prediction Based on a Mathematical Model
AU - Baus, S. S.
AU - Red'ko, Ludmila Anatolievna
AU - Yanushevskaya, M. N.
PY - 2017/4/18
Y1 - 2017/4/18
N2 - There appear certain challenges in defining the dependence of the X-ray radiation intensity change in passing through the material (as fixed by the detector) conditioned by various parameters of an X-ray optical system while designing new modifications of X-ray tomographs. At present, this problem is experimentally solved by selection of voltage corresponding parameter values on an X-ray tube with thickness and type of the studied material considered. To reduce the design time and complexity, a mathematical model of parameter behavior is required to characterize the X-ray optical system in the major working range of values. The present paper investigates the X-ray optical system behavior using methods of mathematical statistics. A regression model has been obtained which matches the change of the X-ray intensity value to the intensity in the X-ray tube. The research has defined the further study direction of X -ray optical system parameters.
AB - There appear certain challenges in defining the dependence of the X-ray radiation intensity change in passing through the material (as fixed by the detector) conditioned by various parameters of an X-ray optical system while designing new modifications of X-ray tomographs. At present, this problem is experimentally solved by selection of voltage corresponding parameter values on an X-ray tube with thickness and type of the studied material considered. To reduce the design time and complexity, a mathematical model of parameter behavior is required to characterize the X-ray optical system in the major working range of values. The present paper investigates the X-ray optical system behavior using methods of mathematical statistics. A regression model has been obtained which matches the change of the X-ray intensity value to the intensity in the X-ray tube. The research has defined the further study direction of X -ray optical system parameters.
UR - http://www.scopus.com/inward/record.url?scp=85018385371&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85018385371&partnerID=8YFLogxK
U2 - 10.1088/1757-899X/189/1/012016
DO - 10.1088/1757-899X/189/1/012016
M3 - Article
AN - SCOPUS:85018385371
VL - 189
JO - IOP Conference Series: Materials Science and Engineering
JF - IOP Conference Series: Materials Science and Engineering
SN - 1757-8981
IS - 1
M1 - 012016
ER -