X-ray production simulation of an electron beam recycled through a betatron's internal target

V. V. Kaplin, L. W. Lombardo, A. A. Mihal'chuk, M. A. Piestrup, S. R. Uglov

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Abstract

An analysis of the circulating dynamics of 6 and 35 MeV electron beams in betatron chambers with quasi-transparent internal targets has been done by means of computer simulation. The spatial and angular distributions of the electron trajectories were studied as the electrons made multiple passes through the thin targets. The beam intensities were observed as a function of the number of passes through 0.01, 0.02, 0.05, and 0.1 mm thick silicon targets. The mean number of passes that an electron makes was determined for each combination of target thickness and beam energy. Using the data obtained from the simulation, the spectral and angular distributions of parametric X-radiation have been calculated for electrons recycled through silicon crystals.

Original languageEnglish
Pages (from-to)244-252
Number of pages9
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume145
Issue number1-2
DOIs
Publication statusPublished - 2 Oct 1998

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ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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