X-ray diffraction radiation in conditions of Cherenkov effect

A. A. Tishchenko, A. P. Potylitsyn, M. N. Strikhanov

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

X-ray diffraction radiation from ultra-relativistic electrons moving near an absorbing target is considered. The emission yield is found to increase significantly in conditions of Cherenkov effect.

Original languageEnglish
Pages (from-to)509-511
Number of pages3
JournalPhysics Letters, Section A: General, Atomic and Solid State Physics
Volume359
Issue number5
DOIs
Publication statusPublished - 4 Dec 2006

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diffraction radiation
electrons
x rays

Keywords

  • Absorption edge
  • Diffraction radiation
  • X-ray Cherenkov radiation

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

X-ray diffraction radiation in conditions of Cherenkov effect. / Tishchenko, A. A.; Potylitsyn, A. P.; Strikhanov, M. N.

In: Physics Letters, Section A: General, Atomic and Solid State Physics, Vol. 359, No. 5, 04.12.2006, p. 509-511.

Research output: Contribution to journalArticle

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