Abstract
An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes ( ). The temperature distribution along the direction perpendicular to the reflecting atomic planes ( ) and the interplanar spacing distribution of atomic planes ( ) are determined as well.
Original language | English |
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Pages (from-to) | 853-856 |
Number of pages | 4 |
Journal | Journal of Applied Crystallography |
Volume | 48 |
DOIs | |
Publication status | Published - 1 Jun 2015 |
Keywords
- external temperature gradients
- interplanar spacing
- temperature distribution
- X-ray diffraction
ASJC Scopus subject areas
- Biochemistry, Genetics and Molecular Biology(all)