Abstract
An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes ( ). The temperature distribution along the direction perpendicular to the reflecting atomic planes ( ) and the interplanar spacing distribution of atomic planes ( ) are determined as well.
| Original language | English |
|---|---|
| Pages (from-to) | 853-856 |
| Number of pages | 4 |
| Journal | Journal of Applied Crystallography |
| Volume | 48 |
| DOIs | |
| Publication status | Published - 1 Jun 2015 |
Keywords
- external temperature gradients
- interplanar spacing
- temperature distribution
- X-ray diffraction
ASJC Scopus subject areas
- Biochemistry, Genetics and Molecular Biology(all)
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Kocharyan, V. R., Gogolev, A. S., Movsisyan, A. E., Beybutyan, A. H., Khlopuzyan, S. G., & Aloyan, L. R. (2015). X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient. Journal of Applied Crystallography, 48, 853-856. https://doi.org/10.1107/S1600576715006913