Abstract
An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes ( ). The temperature distribution along the direction perpendicular to the reflecting atomic planes ( ) and the interplanar spacing distribution of atomic planes ( ) are determined as well.
| Original language | English |
|---|---|
| Pages (from-to) | 853-856 |
| Number of pages | 4 |
| Journal | Journal of Applied Crystallography |
| Volume | 48 |
| DOIs | |
| Publication status | Published - 1 Jun 2015 |
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Keywords
- external temperature gradients
- interplanar spacing
- temperature distribution
- X-ray diffraction
ASJC Scopus subject areas
- Biochemistry, Genetics and Molecular Biology(all)
Cite this
X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient. / Kocharyan, Vagan Rashidovich; Gogolev, A. S.; Movsisyan, A. E.; Beybutyan, A. H.; Khlopuzyan, S. G.; Aloyan, L. R.
In: Journal of Applied Crystallography, Vol. 48, 01.06.2015, p. 853-856.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient
AU - Kocharyan, Vagan Rashidovich
AU - Gogolev, A. S.
AU - Movsisyan, A. E.
AU - Beybutyan, A. H.
AU - Khlopuzyan, S. G.
AU - Aloyan, L. R.
PY - 2015/6/1
Y1 - 2015/6/1
N2 - An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes ( ). The temperature distribution along the direction perpendicular to the reflecting atomic planes ( ) and the interplanar spacing distribution of atomic planes ( ) are determined as well.
AB - An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes ( ). The temperature distribution along the direction perpendicular to the reflecting atomic planes ( ) and the interplanar spacing distribution of atomic planes ( ) are determined as well.
KW - external temperature gradients
KW - interplanar spacing
KW - temperature distribution
KW - X-ray diffraction
UR - http://www.scopus.com/inward/record.url?scp=84930627903&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84930627903&partnerID=8YFLogxK
U2 - 10.1107/S1600576715006913
DO - 10.1107/S1600576715006913
M3 - Article
AN - SCOPUS:84930627903
VL - 48
SP - 853
EP - 856
JO - Journal of Applied Crystallography
JF - Journal of Applied Crystallography
SN - 0021-8898
ER -