X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient

Vagan Rashidovich Kocharyan, A. S. Gogolev, A. E. Movsisyan, A. H. Beybutyan, S. G. Khlopuzyan, L. R. Aloyan

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes ( ). The temperature distribution along the direction perpendicular to the reflecting atomic planes ( ) and the interplanar spacing distribution of atomic planes ( ) are determined as well.

Original languageEnglish
Pages (from-to)853-856
Number of pages4
JournalJournal of Applied Crystallography
Volume48
DOIs
Publication statusPublished - 1 Jun 2015

Keywords

  • external temperature gradients
  • interplanar spacing
  • temperature distribution
  • X-ray diffraction

ASJC Scopus subject areas

  • Biochemistry, Genetics and Molecular Biology(all)

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