X-ray converters for radiation treatment of thin films

V. I. Bespalov, V. V. Ryzhov, I. Yu Turchanovskiǐ

Research output: Contribution to journalArticle

Abstract

The energy absorbed in thin films of selected materials bombarded by x rays emitted in the braking of low-energy electrons (E0<500keV) in converters with various atomic numbers (Z=29-73) is calculated by the Monte Carlo method. The program takes into account both of the K-shell ionization mechanisms that lead to emission of characteristic photons as a result of electron impact and as a result of the photoelectric effect, and the characteristic radiation is shown to make a large contribution to the absorbed energy in thin films. Calculations show that the proper choice of material and thickness of the converter affords a two- to fivefold increase in the energy of the x radiation absorbed in thin films of semiconductor materials.

Original languageEnglish
Pages (from-to)1363-1365
Number of pages3
JournalTechnical Physics
Volume43
Issue number11
DOIs
Publication statusPublished - 1998

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converters
radiation
thin films
photoelectric effect
x rays
braking
electron impact
Monte Carlo method
energy
electron energy
ionization
photons

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

X-ray converters for radiation treatment of thin films. / Bespalov, V. I.; Ryzhov, V. V.; Turchanovskiǐ, I. Yu.

In: Technical Physics, Vol. 43, No. 11, 1998, p. 1363-1365.

Research output: Contribution to journalArticle

Bespalov, V. I. ; Ryzhov, V. V. ; Turchanovskiǐ, I. Yu. / X-ray converters for radiation treatment of thin films. In: Technical Physics. 1998 ; Vol. 43, No. 11. pp. 1363-1365.
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