X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire

Dmitry Dzhigaev, Tomaš Stankevič, Zhaoxia Bi, Sergey Lazarev, Max Rose, Anatoly Shabalin, Juliane Reinhardt, Anders Mikkelsen, Lars Samuelson, Gerald Falkenberg, Robert Feidenhans'L, Ivan A. Vartanyants

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The future of solid-state lighting can be potentially driven by applications of InGaN/GaN core-shell nanowires. These heterostructures provide the possibility for fine-tuning of functional properties by controlling a strain state between mismatched layers. We present a nondestructive study of a single 400 nm-thick InGaN/GaN core-shell nanowire using two-dimensional (2D) X-ray Bragg ptychography (XBP) with a nanofocused X-ray beam. The XBP reconstruction enabled the determination of a detailed three-dimensional (3D) distribution of the strain in the particular nanowire using a model based on finite element method. We observed the strain induced by the lattice mismatch between the GaN core and InGaN shell to be in the range from -0.1% to 0.15% for an In concentration of 30%. The maximum value of the strain component normal to the facets was concentrated at the transition region between the main part of the nanowire and the GaN tip. In addition, a variation in misfit strain relaxation between the axial growth and in-plane directions was revealed.

Original languageEnglish
Pages (from-to)6605-6611
Number of pages7
JournalACS Nano
Volume11
Issue number7
DOIs
Publication statusPublished - 25 Jul 2017

Keywords

  • Bragg ptychography
  • Finite Element Method
  • GaN
  • InGaN
  • nanowire

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire'. Together they form a unique fingerprint.

  • Cite this

    Dzhigaev, D., Stankevič, T., Bi, Z., Lazarev, S., Rose, M., Shabalin, A., Reinhardt, J., Mikkelsen, A., Samuelson, L., Falkenberg, G., Feidenhans'L, R., & Vartanyants, I. A. (2017). X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire. ACS Nano, 11(7), 6605-6611. https://doi.org/10.1021/acsnano.6b08122