UV/X-ray diffraction radiation for non-intercepting micron-scale beam size measurement

L. Bobb, N. Chritin, T. Lefevre, P. Karataev, M. Billing

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Diffraction radiation (DR) is produced when a relativistic charged particle moves in the vicinity of a medium. The electric field of the charged particle polarizes the target atoms which then oscillate, emitting radiation with a very broad spectrum. The spatial-spectral properties of DR are sensitive to a range of electron beam parameters. Furthermore, the energy loss due to DR is so small that the electron beam parameters are unchanged. Therefore DR can be used to develop non-invasive diagnostic tools. The aim of this project is to measure the transverse (vertical) beam size using incoherent DR. To achieve the micron-scale resolution required by CLIC, DR in UV and X-ray spectral-range must be investigated. During the next few years, experimental validation of such a scheme will be conducted on the CesrTA at Cornell University, USA. Here we present the current status of the experiment preparation.

Original languageEnglish
Title of host publicationIBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference
PublisherJoint Accelerator Conferences Website (JACoW)
Pages24-28
Number of pages5
ISBN (Electronic)9783954501199
Publication statusPublished - Jun 2013
Externally publishedYes
Event1st International Beam Instrumentation Conference, IBIC 2012 - Tsukuba, Japan
Duration: 1 Oct 20124 Oct 2012

Publication series

NameIBIC 2012 - Proceedings of the 1st International Beam Instrumentation Conference

Conference

Conference1st International Beam Instrumentation Conference, IBIC 2012
CountryJapan
CityTsukuba
Period1.10.124.10.12

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

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