UV-laser produced plasma in gases and on metal targets

V. F. Tarasenko, E. H. Baksht, S. E. Kunts, A. N. Panchenko, A. V. Fedenev, A. A. Kim, V. A. Sinebrjukhov, S. N. Volkov

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)

    Abstract

    The results of investigation into the use of UV-laser produced plasma for high-current commutation summarized. It is are shown that exciplex lasers can be used as efficient triggers for megavolt gas switches. If the laser spark length is comparable with the switch gap, the triggering delay time and jitter are independent on the arc position in the gap. In other cases, the shortest delay time was observed under focusing on the electrode surface. The plasma formed by exciplex lasers on the metal targets has been studied. The plasma formation thresholds and plasma expansion velocities have been measured.

    Original languageEnglish
    Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
    EditorsR.F. Haglund, J. Neev, R.F. Wood
    Pages99-106
    Number of pages8
    Volume4276
    DOIs
    Publication statusPublished - 2001
    EventCommercial and Biomedical Applications of Ultrashort Pulse Lasers; Laser Plasma Generation and Diagnostics - San Jose, CA, United States
    Duration: 23 Jan 200123 Jan 2001

    Other

    OtherCommercial and Biomedical Applications of Ultrashort Pulse Lasers; Laser Plasma Generation and Diagnostics
    CountryUnited States
    CitySan Jose, CA
    Period23.1.0123.1.01

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    Keywords

    • Breakdown threshold
    • Exciplex lasers
    • Laser plasma
    • Megavolt gas switch

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Condensed Matter Physics

    Cite this

    Tarasenko, V. F., Baksht, E. H., Kunts, S. E., Panchenko, A. N., Fedenev, A. V., Kim, A. A., ... Volkov, S. N. (2001). UV-laser produced plasma in gases and on metal targets. In R. F. Haglund, J. Neev, & R. F. Wood (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4276, pp. 99-106) https://doi.org/10.1117/12.428009