Using the chemical dosimeter to measure the integral characteristics of the pulsed electron radiation

Lily R. Merinova, E. A. Proskurina, L. N. Shiyan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The paper presents the results on the study of the potassium nitrate dosimeter to estimate the characteristics of the pulsed electron radiation with an electron energy of 500 keV. One of the final products formed after potassium nitrate radiation is nitrite ion, whose radiation-chemical yield is constant and it equals 1.6 ion/100 eV. The measured concentration of nitrite ion with the Griess reagent enables to estimate the absorbed dose in any geometrical point of the irradiated volume. The comparable results of the magnitude of the absorbed dose obtained using a film dose color indicator are presented. The possibility to use an aqueous solution of potassium nitrate as a dosimeter, which is equivalent to the irradiated aqueous mediums, is studied. It is shown that the use of the potassium nitrate as a dosimeter is restricted due to the change in radiation-chemical yield of nitrite ions in solutions of different concentration.

Original languageEnglish
Title of host publicationProceedings - 2016 11th International Forum on Strategic Technology, IFOST 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages564-567
Number of pages4
ISBN (Electronic)9781509008551
DOIs
Publication statusPublished - 21 Mar 2017
Event11th International Forum on Strategic Technology, IFOST 2016 - Novosibirsk, Russian Federation
Duration: 1 Jun 20163 Jun 2016

Conference

Conference11th International Forum on Strategic Technology, IFOST 2016
CountryRussian Federation
CityNovosibirsk
Period1.6.163.6.16

Fingerprint

Dosimeters
Nitrate
Potassium
Nitrates
Nitrites
Radiation
Electron
Ions
Dose
Electrons
Estimate
Color
potassium nitrate
Energy

Keywords

  • aqueous solution of potassium nitrate
  • crystalline potassium nitrate dosimeter
  • dosimetry
  • film dosimeter
  • pulsed electron radiation

ASJC Scopus subject areas

  • Ceramics and Composites
  • Computational Mathematics
  • Computer Science Applications
  • Mechanical Engineering
  • Mechanics of Materials
  • Electronic, Optical and Magnetic Materials
  • Control and Optimization

Cite this

Merinova, L. R., Proskurina, E. A., & Shiyan, L. N. (2017). Using the chemical dosimeter to measure the integral characteristics of the pulsed electron radiation. In Proceedings - 2016 11th International Forum on Strategic Technology, IFOST 2016 (pp. 564-567). [7884322] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IFOST.2016.7884322

Using the chemical dosimeter to measure the integral characteristics of the pulsed electron radiation. / Merinova, Lily R.; Proskurina, E. A.; Shiyan, L. N.

Proceedings - 2016 11th International Forum on Strategic Technology, IFOST 2016. Institute of Electrical and Electronics Engineers Inc., 2017. p. 564-567 7884322.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Merinova, LR, Proskurina, EA & Shiyan, LN 2017, Using the chemical dosimeter to measure the integral characteristics of the pulsed electron radiation. in Proceedings - 2016 11th International Forum on Strategic Technology, IFOST 2016., 7884322, Institute of Electrical and Electronics Engineers Inc., pp. 564-567, 11th International Forum on Strategic Technology, IFOST 2016, Novosibirsk, Russian Federation, 1.6.16. https://doi.org/10.1109/IFOST.2016.7884322
Merinova LR, Proskurina EA, Shiyan LN. Using the chemical dosimeter to measure the integral characteristics of the pulsed electron radiation. In Proceedings - 2016 11th International Forum on Strategic Technology, IFOST 2016. Institute of Electrical and Electronics Engineers Inc. 2017. p. 564-567. 7884322 https://doi.org/10.1109/IFOST.2016.7884322
Merinova, Lily R. ; Proskurina, E. A. ; Shiyan, L. N. / Using the chemical dosimeter to measure the integral characteristics of the pulsed electron radiation. Proceedings - 2016 11th International Forum on Strategic Technology, IFOST 2016. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 564-567
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