USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS.

A. D. Pogrebnyak, V. A. Kuz'minykh, K. P. Aref'ev

Division for Mathematics and Computer Sciences

Research output: Contribution to journal › Article › peer-review

Abstract

Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.

Original language	English
Pages (from-to)	1128-1130
Number of pages	3
Journal	Soviet physics. Technical physics
Volume	26
Issue number	9
Publication status	Published - Sep 1981

ASJC Scopus subject areas

Engineering(all)

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title = "USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS.",

abstract = "Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.",

author = "Pogrebnyak, {A. D.} and Kuz'minykh, {V. A.} and Aref'ev, {K. P.}",

year = "1981",

month = sep,

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pages = "1128--1130",

journal = "Soviet Physics, Technical Physics",

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AU - Aref'ev, K. P.

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AB - Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.

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