USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS.

A. D. Pogrebnyak, V. A. Kuz'minykh, K. P. Aref'ev

Research output: Contribution to journalArticle

Abstract

Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.

Original languageEnglish
Pages (from-to)1128-1130
Number of pages3
JournalSoviet physics. Technical physics
Volume26
Issue number9
Publication statusPublished - Sep 1981

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Positron annihilation
surface layer
substrate
Substrates
calculation
material
method

ASJC Scopus subject areas

  • Engineering(all)

Cite this

USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS. / Pogrebnyak, A. D.; Kuz'minykh, V. A.; Aref'ev, K. P.

In: Soviet physics. Technical physics, Vol. 26, No. 9, 09.1981, p. 1128-1130.

Research output: Contribution to journalArticle

Pogrebnyak, A. D. ; Kuz'minykh, V. A. ; Aref'ev, K. P. / USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS. In: Soviet physics. Technical physics. 1981 ; Vol. 26, No. 9. pp. 1128-1130.
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