Abstract
Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.
| Original language | English |
|---|---|
| Pages (from-to) | 1128-1130 |
| Number of pages | 3 |
| Journal | Soviet physics. Technical physics |
| Volume | 26 |
| Issue number | 9 |
| Publication status | Published - Sep 1981 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
Pogrebnyak, A. D., Kuz'minykh, V. A., & Aref'ev, K. P. (1981). USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS. Soviet physics. Technical physics, 26(9), 1128-1130.