Abstract
Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.
Original language | English |
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Pages (from-to) | 1128-1130 |
Number of pages | 3 |
Journal | Soviet physics. Technical physics |
Volume | 26 |
Issue number | 9 |
Publication status | Published - Sep 1981 |
ASJC Scopus subject areas
- Engineering(all)