Abstract
Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.
| Original language | English |
|---|---|
| Pages (from-to) | 1128-1130 |
| Number of pages | 3 |
| Journal | Soviet physics. Technical physics |
| Volume | 26 |
| Issue number | 9 |
| Publication status | Published - Sep 1981 |
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USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS. / Pogrebnyak, A. D.; Kuz'minykh, V. A.; Aref'ev, K. P.
In: Soviet physics. Technical physics, Vol. 26, No. 9, 09.1981, p. 1128-1130.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - USE OF THE POSITRON-ANNIHILATION METHOD TO STUDY THIN SURFACE LAYERS.
AU - Pogrebnyak, A. D.
AU - Kuz'minykh, V. A.
AU - Aref'ev, K. P.
PY - 1981/9
Y1 - 1981/9
N2 - Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.
AB - Results from model calculations and experimental data are utilized to determine minimal thicknesses of layers of materials having different effective atomic numbers on a GaAs substrate, which can be studied by the positron-annihilation method using a **2**2Na( beta ** plus , gamma ) source.
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UR - http://www.scopus.com/inward/citedby.url?scp=0019609147&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0019609147
VL - 26
SP - 1128
EP - 1130
JO - Soviet Physics, Technical Physics
JF - Soviet Physics, Technical Physics
SN - 0038-5662
IS - 9
ER -