Two-layer dielectrics behaviour in the electric field

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (E b) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tan&delta in low and high field were obtained. We suppose that the discovered changes in E b and tanδ with the changing ξ are probably caused b by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.

Original languageEnglish
Title of host publicationConference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report
PublisherIEEE
Pages265-268
Number of pages4
Volume1
Publication statusPublished - 1999
EventProceedings of the 1999 68th Annual Conference on Electrical Insulation and Dielectric Phenomena (1999 CEIDP) - Austin, TX, USA
Duration: 17 Oct 199920 Oct 1999

Other

OtherProceedings of the 1999 68th Annual Conference on Electrical Insulation and Dielectric Phenomena (1999 CEIDP)
CityAustin, TX, USA
Period17.10.9920.10.99

Fingerprint

Electric fields
Permittivity
Polarization

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Building and Construction

Cite this

Lebedev, S. M., Gefle, O. S., Pokholkov, Y. P., & Chichikin, V. I. (1999). Two-layer dielectrics behaviour in the electric field. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report (Vol. 1, pp. 265-268). IEEE.

Two-layer dielectrics behaviour in the electric field. / Lebedev, S. M.; Gefle, O. S.; Pokholkov, Yu P.; Chichikin, V. I.

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. Vol. 1 IEEE, 1999. p. 265-268.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lebedev, SM, Gefle, OS, Pokholkov, YP & Chichikin, VI 1999, Two-layer dielectrics behaviour in the electric field. in Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. vol. 1, IEEE, pp. 265-268, Proceedings of the 1999 68th Annual Conference on Electrical Insulation and Dielectric Phenomena (1999 CEIDP), Austin, TX, USA, 17.10.99.
Lebedev SM, Gefle OS, Pokholkov YP, Chichikin VI. Two-layer dielectrics behaviour in the electric field. In Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. Vol. 1. IEEE. 1999. p. 265-268
Lebedev, S. M. ; Gefle, O. S. ; Pokholkov, Yu P. ; Chichikin, V. I. / Two-layer dielectrics behaviour in the electric field. Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report. Vol. 1 IEEE, 1999. pp. 265-268
@inproceedings{b5e260430a08417ea678223addc731f6,
title = "Two-layer dielectrics behaviour in the electric field",
abstract = "In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (E b) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tan&delta in low and high field were obtained. We suppose that the discovered changes in E b and tanδ with the changing ξ are probably caused b by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.",
author = "Lebedev, {S. M.} and Gefle, {O. S.} and Pokholkov, {Yu P.} and Chichikin, {V. I.}",
year = "1999",
language = "English",
volume = "1",
pages = "265--268",
booktitle = "Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report",
publisher = "IEEE",

}

TY - GEN

T1 - Two-layer dielectrics behaviour in the electric field

AU - Lebedev, S. M.

AU - Gefle, O. S.

AU - Pokholkov, Yu P.

AU - Chichikin, V. I.

PY - 1999

Y1 - 1999

N2 - In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (E b) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tan&delta in low and high field were obtained. We suppose that the discovered changes in E b and tanδ with the changing ξ are probably caused b by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.

AB - In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (E b) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tan&delta in low and high field were obtained. We suppose that the discovered changes in E b and tanδ with the changing ξ are probably caused b by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.

UR - http://www.scopus.com/inward/record.url?scp=0033316390&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033316390&partnerID=8YFLogxK

M3 - Conference contribution

VL - 1

SP - 265

EP - 268

BT - Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

PB - IEEE

ER -