Transverse beam profile imaging of few-micrometer beam sizes based on a scintillator screen

G. Kube, S. Bajt, A. P. Potylitsyn, L. G. Sukhikh, A. V. Vukolov, I. A. Artyukov, W. Lauth

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

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Engineering & Materials Science

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