Transverse beam profile imaging of few-micrometer beam sizes based on a scintillator screen

G. Kube, S. Bajt, A. P. Potylitsyn, L. G. Sukhikh, A. V. Vukolov, I. A. Artyukov, W. Lauth

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

Standard beam profile measurements of high–brightness electron beams based on optical transition radiation (OTR) may be hampered by coherence effects induced by the microbunching instability which render a direct beam imaging impossible. As consequence, for modern linac based 4t h generation light sources as the European XFEL which is currently under construction in Hamburg, transverse beam profile measurements are based on scintillating screen monitors. However, the resolution of a scintillator based monitor is limited due to intrinsic material properties and the observation geometry. In this report, a beam size measurement in the order of a few micrometer is presented using a LYSO scintillator, and discussed in view of the possible achievable resolution.

Original languageEnglish
Title of host publicationProceedings of the 4th International Beam Instrumentation Conference, IBIC 2015
PublisherJoint Accelerator Conferences Website (JACoW)
Pages330-334
Number of pages5
ISBN (Electronic)9783954501762
Publication statusPublished - 1 Jan 2015
Event4th International Beam Instrumentation Conference, IBIC 2015 - Melbourne, Australia
Duration: 13 Sep 201517 Sep 2015

Publication series

NameProceedings of the 4th International Beam Instrumentation Conference, IBIC 2015

Conference

Conference4th International Beam Instrumentation Conference, IBIC 2015
CountryAustralia
CityMelbourne
Period13.9.1517.9.15

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

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